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专利名称：Digital signal analysis with evaluation of
selected signal bits
发明人：Moll, Joachim申请号：EP071011.7申请日：20070125公开号：EP1863214A1公开日：20071205
专利附图：
摘要：The invention refers to analyzing a digitally modulated test signal (S) receivedfrom a device under test -DUT-, comprising providing a first sampled signal (D1) byassigning a first sequence of digital values as result of a level comparison of the test
signal (5) with a first threshold (Vth1) at first successive timing points (TS1), generating afirst masking signal (M1) indicating matches between a second sequence of digital values(D2, D2') expected from the DUT and one or a plurality of first data patterns, andanalyzing the first sampled signal (D1) in conjunction with the masking signal (M1).
申请人：Agilent Technologies, Inc.
地址：5301 Stevens Creek Boulevard Santa Clara, California 95051 US
国籍：US
代理机构：Barth, Daniel Mathias
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