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专利名称:Systems and methods for selecting imaging
data for principle components analysis
发明人:Scott David Wollenweber申请号:US14563047申请日:20141208公开号:US09684973B2公开日:20170620
专利附图:
摘要:A method is provided that includes acquiring, with a detector defining a field ofview (FOV), emission imaging data of an object over the FOV. The method also includesdetermining, with one or more processing units, a volume of interest (VOI) of the
emission imaging data, wherein the VOI defines a volume smaller than an imaged volumeof the object. Further, the method includes performing, with the one or more processingunits, a multivariate data analysis on the VOI to generate a waveform for the VOI. Also,the method includes determining, with the one or more processing units, an amount ofmotion for at least the VOI based on the waveform. The method further includesdisplaying, on a display unit, at least one of the amount of motion or an imagereconstructed based on the emission imaging data.
申请人:General Electric Company
地址:Schenectady NY US
国籍:US
代理机构:The Small Patent Law Group, LLC
代理人:Dean D. Small
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